Phase sensitive experiments in ferromagnetic-based Josephson junctions

Physical Review Letters

Volumn 90, Issue 16, 2003, Pages

  Guichard, W ^a   Aprili, M ^b   Bourgeois, O ^a   Kontos, T ^b   Lesueur, J ^b,c   Gandit, P ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b CNRS   (France)

^c PSL RESEARCH UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; FERROMAGNETIC MATERIALS; GROUND STATE; MAGNETIC FLUX; MICROSCOPIC EXAMINATION; QUANTUM THEORY; SQUIDS; THICKNESS MEASUREMENT;

DIFFRACTION PATTERN; FERROMAGNETI BASED JOSEPHSON JUNCTIONS; JOSEPHSON COUPLING; QUANTUM FLUX;

JOSEPHSON JUNCTION DEVICES;

EID: 0038202059     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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