Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

Journal of the Optical Society of America B: Optical Physics

Volumn 20, Issue 4, 2003, Pages 741-751

  Margheri, Giancarlo ^a   Giorgetti, Emilia ^a   Sottini, Stefano ^a   Toci, Guido ^a  

^a IFAC CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; NANOSTRUCTURED MATERIALS; SURFACE PLASMON RESONANCE;

OPTICAL MIXING;

NONLINEAR OPTICS;

EID: 0038173564     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.20.000741     Document Type: Article

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