Dispersive surface plasmon microscopy for the characterization of ultrathin organic films

Applied Physics Letters

Volumn 69, Issue 16, 1996, Pages 2336-2337

  Knobloch, Harald ^a   Von Szada Borryszkowski, Günther ^a   Woigk, Sabine ^a   Helms, Andreas ^a   Brehmer, Ludwig ^a  

^a UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR; COPPER COMPOUNDS; ELECTROMAGNETIC DISPERSION; ELECTRON MICROSCOPY; LIGHT REFLECTION; ORGANOMETALLICS; REFRACTIVE INDEX; RESONANCE; SPECTRUM ANALYSIS;

COPPER PHTHALOCYANINE; INCIDENT ANGLE; PLASMON SURFACE POLARITONS; SURFACE PLASMON MICROSCOPY; WHITE LIGHT;

ULTRATHIN FILMS;

EID: 0030264864     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117516     Document Type: Article

References (16)

1. W. Knoll, in Materials Science and Technology, edited by R. W. Cahn, P. Haasen, and E. J. Kramer (VCH, Weinheim, 1993), Vol. 12, p. 529ff.
2. W. Knoll, Makromol. Chem. 192, 2827 (1991).
3. J. G. Gordon and J. D Swalen, Opt. Commun. 22, 374 (1977).
4. H. Raether, in Physics of Thin Films, edited by G. Haas, M. Francome, and R. W. Hoffmann (Wiley, New York, 1977).
5. E. Burstein, W. P. Chen, Y. J. Chen, and A. Hartstein, J. Vac. Sci. Techno). 11, 1004 (1974).
6. I. Pockrand, Surf. Sci. 72, 577 (1978).
7. E. Kretschmann, Z. Phys. 241, 313 (1971).
8. E. Kretschmann, Opt. Commun. 6, 185 (1972).
9. B. Rothenhäusler and W. Knoll, Nature (London) 332, 615 (1988).
10. W. Hickel, B. Rothenhäusler, and W. Knoll, J. Appl. Phys. 66, 4832 (1989).
11. W. Hickel and W. Knoll, J. Appl. Phys. 67, 3572 (1990).
12. W. Hickel, D. Kamp, and W. Knoll, Nature (London) 339, 186 (1989).
13. W. Hickel, Ph.D. thesis, Mainz, Germany, 1990.
14. A. Helms, Diploma thesis, Potsdam, 1996.
15. M. K. Debe, J. Vac. Sci. Technol. A 10, 2816 (1992).
16. P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).