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Volumn 78, Issue 7, 2001, Pages 856-858
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Direct observation of self-focusing near the diffraction limit in polycrystalline silicon film
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0038155548
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1335845 Document Type: Article |
Times cited : (38)
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References (10)
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