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Volumn 78, Issue 7, 2001, Pages 856-858

Direct observation of self-focusing near the diffraction limit in polycrystalline silicon film

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038155548     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1335845     Document Type: Article
Times cited : (38)

References (10)
  • 9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.