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Volumn 13, Issue 12, 1996, Pages 2720-2723

Z scan using circularly symmetric beams

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC FIELDS; FOURIER TRANSFORMS; INTEGRAL EQUATIONS; INTEGRATION; LASER BEAMS; LIGHT ABSORPTION; LIGHT MEASUREMENT; LIGHT TRANSMISSION; NUMERICAL ANALYSIS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS;

EID: 0030417810     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.13.002720     Document Type: Article
Times cited : (55)

References (7)
  • 4
    • 84975563704 scopus 로고
    • Excited-state nonlinearity in polythiophene thin films investigated by the Z-scan technique
    • L. Yang, R. Dorsinville, Q. Z. Wang, P. X. Ye, and R. R. Alfano, "Excited-state nonlinearity in polythiophene thin films investigated by the Z-scan technique," Opt. Lett. 17, 323 (1992).
    • (1992) Opt. Lett. , vol.17 , pp. 323
    • Yang, L.1    Dorsinville, R.2    Wang, Q.Z.3    Ye, P.X.4    Alfano, R.R.5
  • 6
    • 0000337158 scopus 로고
    • Z-scan technique using top-hat beams
    • W. Zhao and P. Palffy-Muhoray, "Z-scan technique using top-hat beams," Appl. Phys. Lett. 63, 1613 (1993).
    • (1993) Appl. Phys. Lett. , vol.63 , pp. 1613
    • Zhao, W.1    Palffy-Muhoray, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.