High-resolution birefringence imaging in three-dimensional stressed models by Fourier polarimetry

Applied Optics

Volumn 40, Issue 28, 2001, Pages 4940-4946

  Berezhna, Svitlana ^a,b   Berezhnyy, Ihor ^a   Takashi, Masahisa ^a  

^a AOYAMA GAKUIN UNIVERSITY   (Japan)

^b NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; IMAGING TECHNIQUES; LIGHT INTERFERENCE; LIGHT POLARIZATION; PHOTOELASTICITY; POLARIMETERS;

STRESSED MODELS;

FOURIER OPTICS;

EID: 0038150074     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.004940     Document Type: Article

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