Integrated photoelasticity through imaging Fourier polarimetry of an elliptic retarder

Applied Optics

Volumn 40, Issue 5, 2001, Pages 644-651

  Berezhna, Svitlana ^a   Berezhnyy, Ihor ^b   Takashi, Masahisa ^a  

^a AOYAMA GAKUIN UNIVERSITY   (Japan)

^b INSTITUTE OF PHYSICAL OPTICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; PHASE MEASUREMENT; POLARIMETERS;

ELLIPTIC RETARDERS;

PHOTOELASTICITY;

EID: 0004113750     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.000644     Document Type: Article

References (20)

1. H. Aben, Integrated Photoelasticity (McGraw-Hill, New York, 1979).
2. J. F. Doyle and H. T. Danyluk, “Integrated photoelasticity for axisymmetric problems,” Exp. Mech. 18, 215-220 (1978).
3. H. Kubo and R. Nagata, “Determination of dielectric tensor field in weakly inhomogeneous anisotropic media,” J. Opt. Soc. Am. 69, 604-610 (1979).
4. H. Aben, “Integrated photoelasticity as tensor field tomography,” in Proceedings of the International Symposium on Photoelasticity (Japan Society of Mechanical Engineering, Tokyo, 1986), pp. 243-250.
5. Y. A. Andrienko, M. S. Dubovikov and A. D. Gladun, “Optical tomography of a birefringent medium,” J. Opt. Soc. Am. A 9, 1761-1764 (1992).
6. Y. A. Andrienko, M. S. Dubovikov, and A. D. Gladun, “Optical tensor field tomography: the Kerr effect and axisymmetric integrated photoelasticity,” J. Opt. Soc. Am. A 9, 1765-1768 (1992).
7. Y. A. Andrienko and M. S. Dubovikov, “Optical tomography of tensor fields: the general case,” J. Opt. Soc. Am. A 11, 1628-1631 (1994).
8. R. A. Tomlinson and E. A. Patterson, “Determination of characteristic parameters for integrated photoelasticity using phase stepping,” in Proceedings of the SEMAnnual Meeting on Theoretical Experimental, and Computer Mechanics (Society for Experimental Mechanics, Bethel, Conn., 1998), pp. 118-121.
9. R. A. Tomlinson and E. A. Patterson, “Evaluating characteristic parameters in integrated photoelasticity,” in Proceedings of the Eleventh International Conference on Experimental Mechanics (Balkema, Rotterdam, The Netherlands, 1998), pp. 495-500.
10. S. K. Mangal and K. Ramesh, “Determination of characteristic parameters in integrated photoelasticity by phase-shifting technique,” Opt. Lasers Eng. 31, 263-278 (1999).
11. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1997).
12. A. S. Voloshin and A. S. Redner, “Automated measurement of birefringence: development and experimental evaluation of the technique,” Exp. Mech. 28, 252-257 (1989).
13. R. M. A. Azzam, “A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices,” Opt. Commun. 25, 137-140 (1978).
14. J. L. Pezanniti and R. A. Chipman, “Mueller matrix imaging polarimetry,” Opt. Eng. 34, 1558-1568 (1995).
15. R. W. Collins and J. Koh, “Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy or surfaces and films,” J. Opt. Soc. Am. A 16, 1997-2006 (1999).
16. S. Yu Berezhna, I. V. Berezhnyi, and M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics (Japan Society of Mechanical Engineering), Tokyo, (1999), Vol. 2, pp. 635-640.
17. C. Buckberry and D. Towers, “New approaches to the full-field analysis of photoelastic stress patterns,” Opt. Lasers Eng. 24, 415-428 (1996).
18. A. D. Nurse, “Full-field automated photoelasticity by use of a three-wavelength approach to phase stepping,” Appl. Opt. 36, 5781-5786 (1997).
19. S. Yu. Berezhna, I. V. Berezhnyy, and M. Takashi, “Stress tensor field tomography through polarimetry: accuracy of optical data,” in Proceedings of the Fourth International Workshop on Advances in Experimental Mechanics (University of Ljubljana, Ljubljana, Slovenia, 1999), pp. 117-131.
20. A. S. Kobayashi, ed., Handbook on Experimental Mechanics (Society for Experimental Mechanics, Bethel, Conn., 1993).