Full-field automated photoelasticity by fourier polarimetry with three wavelengths

Applied Optics

Volumn 40, Issue 1, 2001, Pages 52-61

  Berezhna, Svitlana ^a   Berezhnyy, Ihor ^b   Voloshin, Arkady ^c  

^a INSTITUTE OF PHYSICAL OPTICS   (Ukraine)

^b AOYAMA GAKUIN UNIVERSITY   (Japan)

^c Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA PROCESSING; POLARIMETERS; SPURIOUS SIGNAL NOISE;

FOURIER POLARIMETRY;

PHOTOELASTICITY;

EID: 0012874204     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.000052     Document Type: Article

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