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Volumn , Issue , 2002, Pages 672-676

Layout driven decomposition with congestion consideration

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT STRUCTURES; COMMON SUBEXPRESSION; DECOMPOSITION ALGORITHM; DEPENDENCY RELATION; EXTRACTION PROCESS; INTERCONNECT DELAY; LOGIC RESTRUCTURING; OBJECTIVE FUNCTIONS;

EID: 0038114471     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998371     Document Type: Conference Paper
Times cited : (9)

References (11)
  • 6
    • 0026883868 scopus 로고
    • The testability-preserving concurrent decomposition and factorization of boolean expressions
    • June
    • J. Rajski and J. Vasudevamurthy, "The Testability-Preserving Concurrent Decomposition and Factorization of Boolean Expressions", In IEEE Trans. on CAD, Vol. 11, No. 6, June 1992, pp. 778-793
    • (1992) IEEE Trans. on CAD , vol.11 , Issue.6 , pp. 778-793
    • Rajski, J.1    Vasudevamurthy, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.