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Volumn 39, Issue 16, 2000, Pages 2584-2591

Gap measurement by position-sensitive detectors

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DIGITAL SIGNAL PROCESSING; LASER BEAMS; LITHOGRAPHY; MASKS; SUBSTRATES;

EID: 0038109719     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002584     Document Type: Article
Times cited : (36)

References (13)
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    • H. Jeong and M. A. Hartney, “Optical projection system for gigabit DRAMs, ” J. Vac. Sci. Technol. B 11, 2675-2679 (1993).
    • (1993) J. Vac. Sci. Technol. B , vol.11 , pp. 2675-2679
    • Jeong, H.1    Hartney, M.A.2
  • 5
    • 0030102433 scopus 로고    scopus 로고
    • FPD and IC fabrication similarities and differences
    • M. S. Lucas, “FPD and IC fabrication similarities and differences, ” Microlithogr. World 5, 5-8 (1996).
    • (1996) Microlithogr. World , vol.5 , pp. 5-8
    • Lucas, M.S.1
  • 6
    • 0038242761 scopus 로고    scopus 로고
    • Simultaneous measurement of gap and superposition in a precision aligner for x-ray nanolithography
    • E. E. Moon, P. N. Everett, and H. I. Smith, “Simultaneous measurement of gap and superposition in a precision aligner for x-ray nanolithography, ” J. Vac. Sci. Technol. B 14, 3969-3973 (1996).
    • (1996) J. Vac. Sci. Technol. B , vol.14 , pp. 3969-3973
    • Moon, E.E.1    Everett, P.N.2    Smith, H.I.3
  • 7
    • 0013063487 scopus 로고    scopus 로고
    • Noncontact measurement of étalon spacing using a retroreflection technique
    • P. J. Thomas, R. Mani, and N. Khali, “Noncontact measurement of étalon spacing using a retroreflection technique, ” Rev. Sci. Instrum. 70, 2225-2229 (1999).
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 2225-2229
    • Thomas, P.J.1    Mani, R.2    Khali, N.3
  • 8
    • 84975590022 scopus 로고
    • Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer
    • L. M. Smith and C. C. Dobson, “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer, ” Appl. Opt. 28, 3339-3342 (1989).
    • (1989) Appl. Opt. , vol.28 , pp. 3339-3342
    • Smith, L.M.1    Dobson, C.C.2
  • 9
    • 0028512714 scopus 로고
    • Use of the fast Fourier transform method for analyzing linear and equispaced Fizeau fringes
    • G. Lai and T. Yatagai, “Use of the fast Fourier transform method for analyzing linear and equispaced Fizeau fringes, ” Appl. Opt. 33, 5935-5940 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 5935-5940
    • Lai, G.1    Yatagai, T.2
  • 10
    • 84955326631 scopus 로고
    • Mirau correlation microscope
    • G. S. Kino and S. S. C. Chim, “Mirau correlation microscope, ” Appl. Opt. 29, 3775-3783 (1990).
    • (1990) Appl. Opt. , vol.29 , pp. 3775-3783
    • Kino, G.S.1    Chim, S.S.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.