Measuring electrostatic double-layer forces on HOPG at high surface potentials

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 149, Issue 1-3, 1999, Pages 145-150

  Döppenschmidt, Astrid ^a   Butt, Hans Jürgen ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

AFM; DLVO; SFM; Surface Force

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLYTES; SILICON NITRIDE; SOLUTIONS; SURFACES;

HIGHLY ORIENTED PYROLYTIC GRAPHITE; POISSON-BOLTZMANN THEORY; SURFACE FORCE MEASUREMENT;

GRAPHITE;

ELECTROLYTE; GRAPHITE;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; ELECTRIC POTENTIAL; ELECTRODE; FORCE; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 0038080502     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(98)00583-4     Document Type: Conference Paper

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