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Chemical analysis was performed by SEM. Crystalline samples were placed on an adhesive carbon tape attached to a brass disk. No carbon coating was necessary for these narrow band gap semiconductors. The samples were then bombarded with a 15 eV electron beam over at least 15 1-micron diameter areas, to determine the elements present and to then average the ratio of gold and iodine. Compositional precision was found to be within 5% error. Data was collected by using a JEOL JSM 6400 scanning electron microscope equipped with a wave-dispersive spectrometer (WDS).
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