Evaluation of solid-state camera systems in varying illumination conditions

Optical Engineering

Volumn 40, Issue 6, 2001, Pages 896-901

  Laitinen, J ^a   Saviaro, J ^a   Ailisto, H ^a  

^a OULU UNIVERSITY OF APPLIED SCIENCES   (Finland)

Author keywords

Evaluation of CCD and CMOS cameras; Low light level imaging; Surveillance; Wireless image transmission

Indexed keywords

CALCULATIONS; CAMERAS; CELLULAR TELEPHONE SYSTEMS; CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; CONSUMER ELECTRONICS; GAIN CONTROL; IMAGE COMMUNICATION SYSTEMS; SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE; WIRELESS TELECOMMUNICATION SYSTEMS;

MOBILE PHONE; SOLID STATE CAMERA SYSTEMS; WIRELESS IMAGE TRANSMISSION;

IMAGING SYSTEMS;

EID: 0035359228     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1365937     Document Type: Article

References (9)

1. CCD transfer method-standard for absolute performance of CCDs and digital CCD camera systems
2. Dynamic range in automated visual web inspection
3. Method for determining the electron number in charge-coupled measurement devices
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5. New generation CCDs: Applications and performance results
6. Design and performance of a metrology camera with 6-and 28-million pixel CCD sensors
7. Experimental evaluation of CCD and CMOS cameras in low-high-level conditions
8. Overview of CMOS image sensors