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Volumn 4398, Issue , 2001, Pages 50-60
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Influence of depolarization effects in interferometric measurement methods
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Author keywords
Depolarization; Interferometry; Perfectly conducting rough surface; Simulation; Speckle field
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Indexed keywords
COMPUTER SIMULATION;
ELECTROMAGNETIC FIELDS;
LIGHT POLARIZATION;
LIGHT SCATTERING;
LIGHTING;
OPTICAL CORRELATION;
PHOTODETECTORS;
DEPOLARIZATION;
INTERFEROMETRY;
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EID: 0035758301
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.445568 Document Type: Conference Paper |
Times cited : (3)
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References (12)
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