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Volumn 4398, Issue , 2001, Pages 50-60

Influence of depolarization effects in interferometric measurement methods

Author keywords

Depolarization; Interferometry; Perfectly conducting rough surface; Simulation; Speckle field

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; LIGHT POLARIZATION; LIGHT SCATTERING; LIGHTING; OPTICAL CORRELATION; PHOTODETECTORS;

EID: 0035758301     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445568     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 1
    • 35949044983 scopus 로고
    • An image-shearing speckle-pattern interferometer for measuring bending moments
    • J.A. Leendertz, J.N. Butters, "An image-shearing speckle-pattern interferometer for measuring bending moments", Journal of Physics E: Scientific Instruments, 6, pp. 1107-1110, 1973.
    • (1973) Journal of Physics E: Scientific Instruments , vol.6 , pp. 1107-1110
    • Leendertz, J.A.1    Butters, J.N.2
  • 2
    • 0016071169 scopus 로고
    • A speckle-shearing interferometer: A tool for measuring derivatives of surface displacements
    • Y.Y. Hung, "A Speckle-Shearing Interferometer: A Tool for Measuring Derivatives of Surface Displacements", Optics Communications, 11, No. 2, pp. 132-135, 1974.
    • (1974) Optics Communications , vol.11 , Issue.2 , pp. 132-135
    • Hung, Y.Y.1
  • 3
    • 0029757208 scopus 로고    scopus 로고
    • Shearography for non-destructive evaluation of composite structures
    • Y.Y. Hung, "Shearography for non-destructive evaluation of composite structures", Optics and Lasers in Engineering, 24, pp. 161-182, 1996.
    • (1996) Optics and Lasers in Engineering , vol.24 , pp. 161-182
    • Hung, Y.Y.1
  • 4
    • 0032671363 scopus 로고    scopus 로고
    • Some ways to improve the recognition of imperfections in large scale components using shearography
    • W. Osten, M. Kalms, W. Jüptner, "Some Ways to Improve the Recognition of Imperfections in Large Scale Components Using Shearography", Proc. SPIE, Vol. 3745, pp. 244-256, 1999.
    • (1999) Proc. SPIE , vol.3745 , pp. 244-256
    • Osten, W.1    Kalms, M.2    Jüptner, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.