High resolution x-ray tomography with applications in biology and materials science

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 607-613

  Schneider, G ^a   Denbeaux, G ^a   Anderson, E ^a   Pearson, A ^a   Bates, W ^a   Vogt, S ^b   Knochel C ^c   Meyer, M A ^d   Zschech, E ^d  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF GÖTTINGEN   (Germany)

^d IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGY; ELECTROMIGRATION; GRAIN BOUNDARIES; IMAGING TECHNIQUES; MASS TRANSFER; MATERIALS SCIENCE; OPTICAL RESOLVING POWER; PROTEINS; X RAY MICROSCOPES;

FRESNEL ZONE PLATES; HIGH RESOLUTION X RAY TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

EID: 0038025650     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030155     Document Type: Conference Paper

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