A proposal for both plasma ion- and electron-temperature diagnostics under simultaneous incidence of particles and x-rays into a semiconductor on the basis of a proposed model for a semiconductor detector response

Plasma Physics and Controlled Fusion

Volumn 45, Issue 5, 2003, Pages 807-821

  Numakura, T ^a   Cho, T ^a   Kohagura, J ^a   Hirata, M ^a   Minami, R ^a   Yoshida, M ^a   Nakashima, Y ^a   Tamano, T ^a   Yatsu, K ^a   Miyoshi, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DETECTORS; ELECTRONS; HIGH ENERGY PHYSICS; IONS; PARTICLE BEAMS; PLASMA DIAGNOSTICS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR MATERIALS; SILICA; TEMPERATURE; X RAYS;

ELECTRON TEMPERATURE; NEUTRAL PARTICLE ANALYSER; PARTICLE ENERGIES; PLASMA ION; RESPONSE THEORY; SEMICONDUCTOR DETECTOR RESPONSE;

PLASMA THEORY;

EID: 0038021485     PISSN: 07413335     EISSN: None     Source Type: Journal    
DOI: 10.1088/0741-3335/45/5/321     Document Type: Article

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