Characterization of new semiconductor detectors for x-ray tomography in the ASDEX Upgrade Tokamak and its generalized physics interpretations

Review of Scientific Instruments

Volumn 68, Issue 1, 1997, Pages 774-777

  Cho, T ^a   Hirata, M ^a   Kohagura, J ^a   Kanke, S ^a   Takahashi, K ^a   Sakamoto, Y ^a   Okamura, T ^a   Yatsu, K ^a   Tamano, T ^a   Hirano, K ^b   Maezawa, H ^b   Tanaka, S ^c   Bessenrodt Weberpals, M ^d  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b National Laboratory for High Energy Physics   (Japan)

^c FUKUI NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^d MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001237127     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147913     Document Type: Article

References (11)

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6. T. Cho et al., J. Appl. Phys. 72, 3363 (1992).
7. M. Bessenrodt-Weberpals et al., Max Planck Institute for Plasma Physics Report No. IPP 1/290, 1995 (unpublished).
8. T. Cho et al., Phys. Rev. A 46, 3024 (1992).
9. J. Kohagura et al., Appl. Radiat. Isot. 46, 489 (1995).
10. T. Cho et al. Rev. Sci. Instrum. 66, 2300 (1995).
11. M. Hirata et al., Nucl. Instrum. Methods Phys. Res. B 66, 479 (1992).