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Volumn , Issue , 2003, Pages 1181-1189

RF PA module substrate via reliability

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; FAILURE ANALYSIS; FINITE ELEMENT METHOD; RELIABILITY; SUBSTRATES; SURFACE MOUNT TECHNOLOGY; THERMAL CYCLING; THICKNESS MEASUREMENT;

EID: 0038012350     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (11)
  • 1
    • 0026376187 scopus 로고    scopus 로고
    • Predicting plated-through-hole reliability in high temperature manufacturing processes
    • R. Iannuzzelli, "Predicting Plated-Through-Hole Reliability in High Temperature Manufacturing Processes," Proc ECTC 1991, pp. 410-421.
    • Proc ECTC 1991 , pp. 410-421
    • Iannuzzelli, R.1
  • 2
    • 0024139271 scopus 로고    scopus 로고
    • Mathematical model of plated-through-hole structure under a load induced by thermal mismatch
    • B. Mirman, "Mathematical Model of Plated-Through-Hole Structure Under a Load Induced by Thermal Mismatch," International Thermal Conference, 1988.
    • International Thermal Conference, 1988
    • Mirman, B.1
  • 3
    • 0028368687 scopus 로고
    • Plated through hole reliability in printed curcuit boards which utilize direct power / ground plane interconnection
    • Second Quarter
    • S. Fauser, C. Ramirex, L. Cartwrigt, "Plated Through Hole Reliability in Printed Curcuit Boards Which Utilize Direct Power / Ground Plane Interconnection," International Journal of Microcircuits and Electronic Packaging, Volume 17, Number 2, Second Quarter 1994, pp. 127-134.
    • (1994) International Journal of Microcircuits and Electronic Packaging , vol.17 , Issue.2 , pp. 127-134
    • Fauser, S.1    Ramirex, C.2    Cartwrigt, L.3
  • 4
  • 5
    • 46149147205 scopus 로고    scopus 로고
    • Thermal reliability of laser ablated microvias and standard through-hole technologies as a function of materials and processing
    • T. Young, F. Polakovic, M. Carano, "Thermal Reliability of Laser Ablated Microvias and Standard Through-Hole Technologies as a Function of Materials and Processing," Proc IPC Printed Circuits Expo, 2000, pp. S09-6-1 to S09-6-10.
    • Proc IPC Printed Circuits Expo, 2000
    • Young, T.1    Polakovic, F.2    Carano, M.3
  • 6
    • 0029218601 scopus 로고    scopus 로고
    • Temperature dependent mechanical behavior of plastic packaging materials
    • R. Darveaux, L. Norton, and F. Carney, "Temperature Dependent Mechanical Behavior of Plastic Packaging Materials," Proc. ECTC, 1995, pp. 1054-1058.
    • Proc. ECTC, 1995 , pp. 1054-1058
    • Darveaux, R.1    Norton, L.2    Carney, F.3
  • 7
    • 0037738264 scopus 로고
    • CINDAS Report 88, Purdue University, October
    • CINDAS Report 88, Purdue University, October 1987.
    • (1987)
  • 8
    • 0037738263 scopus 로고
    • CINDAS Report 105, Purdue University, December
    • CINDAS Report 105, Purdue University, December 1992.
    • (1992)
  • 9
    • 0037738265 scopus 로고    scopus 로고
    • Vendor data sheets
    • Vendor data sheets.
  • 10
    • 0038075850 scopus 로고    scopus 로고
    • Materials Engineering, Penton Publishing
    • Materials Selector 1988, Materials Engineering, Penton Publishing.
    • Materials Selector 1988
  • 11
    • 0003741671 scopus 로고
    • Results of the IPC copper foil ductility round-robin study
    • IPC Publication No. 947
    • W. Engelmaier, "Results of the IPC Copper Foil Ductility Round-Robin Study," IPC Publication No. 947, 1987.
    • (1987)
    • Engelmaier, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.