Investigation of ESD devices in 0.18-μm SiGe BiCMOS process

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 357-360

  Chen, Shiao Shien ^a   Chen, Tung Yang ^a   Tang, Tien Hao ^a   Hsu, Tsun Lai ^a   Tseng, Hua Chou ^a   Chen, Jen Kon ^a   Chou, Chiu Hsiang ^a,b  

^a UNITED MICROELECTRONICS CORPORATION   (Taiwan)

^b PROVIDENCE UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; HETEROJUNCTION BIPOLAR TRANSISTORS; NATURAL FREQUENCIES; SEMICONDUCTING SILICON COMPOUNDS;

TRIGGER VOLTAGE;

CMOS INTEGRATED CIRCUITS;

EID: 0037972719     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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