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Volumn 742, Issue , 2002, Pages 227-232

Afterglow thermal oxidation of silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVES; OXIDATION; PHOTORESISTS; PLASMAS;

EID: 0037955952     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-742-k4.7     Document Type: Article
Times cited : (2)

References (9)
  • 1
    • 0035971877 scopus 로고    scopus 로고
    • Comparative surface studies on wet and dry sacrificial thermal oxidation on silicon carbide
    • A. Koh, A. Kestle, C. Wright, S.P. Wilks, P.A. Mawby and W.R. Bowen, "Comparative Surface Studies on Wet and Dry Sacrificial Thermal Oxidation on Silicon Carbide," Appl. Surf.Sci.,23(2001).
    • (2001) Appl. Surf.Sci. , vol.23
    • Koh, A.1    Kestle, A.2    Wright, C.3    Wilks, S.P.4    Mawby, P.A.5    Bowen, W.R.6
  • 3
  • 5
    • 0020909662 scopus 로고
    • Application of EPR spectroscopy to oxidative removal of organic materials
    • J.M. Cook and B.W. Benson, "Application of EPR Spectroscopy to Oxidative Removal of Organic Materials," J. Electrochem. Soc., 130, 2459-2464, (1983).
    • (1983) J. Electrochem. Soc. , vol.130 , pp. 2459-2464
    • Cook, J.M.1    Benson, B.W.2
  • 6
    • 0022781974 scopus 로고
    • High rate photoresist stripping in an oxygen afterglow
    • J.E. Spencer, R.A. Borel, and A.M. Hoff, "High Rate Photoresist Stripping in an Oxygen Afterglow," ibid., 133, 1922-1925 (1986).
    • (1986) J. Electrochem. Soc. , vol.133 , pp. 1922-1925
    • Spencer, J.E.1    Borel, R.A.2    Hoff, A.M.3
  • 7
    • 12744256398 scopus 로고
    • Atomic oxygen and the thermal oxidation of silicon
    • A.M. Hoff and J. Ruzyllo, "Atomic Oxygen and the Thermal Oxidation of Silicon," Appl. Phys. Lett., 52, 1264-1265 (1988).
    • (1988) Appl. Phys. Lett. , vol.52 , pp. 1264-1265
    • Hoff, A.M.1    Ruzyllo, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.