Interfaces with vapor-evaporated polyaniline thin films

Applied Physics A: Materials Science and Processing

Volumn 77, Issue 1, 2003, Pages 155-158

  Xu, B ^a   Caruso, A N ^a   Dowben, P A ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; EVAPORATION; FLUORINE CONTAINING POLYMERS; INTERFACES (MATERIALS); PHOTOEMISSION; SILICON; SODIUM; SPECTROMETERS; SUBSTRATES; X RAY SPECTROSCOPY;

ANGLE-RESOLVED X-RAY PHOTOEMISSION SPECTROSCOPY; FLAT BAND MODEL; POLYANILINE THIN FILM; SPECTROMETER VACUUM SYSTEM; VACUUM DEPOSITION;

PLASTIC FILMS;

EID: 0037934290     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2082-z     Document Type: Article

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