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Volumn 22, Issue 9, 2000, Pages 757-765

Influence of vacuum on fracture and fatigue behavior in a single aramid fiber

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING (DEFORMATION); COMPOSITE MICROMECHANICS; ENVIRONMENTAL CHAMBERS; FIBERS; FRACTOGRAPHY; FRACTURE MECHANICS; VACUUM APPLICATIONS;

EID: 0034291031     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0142-1123(00)00063-3     Document Type: Article
Times cited : (27)

References (29)
  • 5
    • 0344001275 scopus 로고    scopus 로고
    • Materials science of microelectromechanical systems (MEMS) devices
    • A.H. Heuer, Jacobs S.J.
    • Minoshima K., Inoue S., Terada T., Komai K. Materials science of microelectromechanical systems (MEMS) devices. Heuer A.H., Jacobs S.J. MRS Symposium Proceedings. 546:1999;15-20.
    • (1999) MRS Symposium Proceedings , vol.546 , pp. 15-20
    • Minoshima, K.1    Inoue, S.2    Terada, T.3    Komai, K.4
  • 17
    • 85031549905 scopus 로고    scopus 로고
    • Du Pont/Toray Kevlar Co., DTK-TO1 91.2
    • Aramid Kevlar Technical Report, Du Pont/Toray Kevlar Co., DTK-TO1 91.2.
    • Aramid Kevlar Technical Report


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.