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Volumn 206, Issue , 2003, Pages 1072-1076

Formation of buried oxide layers in titanium by high-fluence oxygen ion implantation

Author keywords

Ion implantation; Phase formation; Titanium oxide; X ray diffraction

Indexed keywords

MICROSTRUCTURE; MORPHOLOGY; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0037904992     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00913-3     Document Type: Conference Paper
Times cited : (9)

References (13)
  • 9
  • 10
    • 0037967575 scopus 로고    scopus 로고
    • Powder Diffraction File, Joint Commitee on Powder Diffraction Standarde, JCPDF, Park Lane, 1989
    • Powder Diffraction File, Joint Commitee on Powder Diffraction Standarde, JCPDF, Park Lane, 1989.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.