A hexane solution deposition of SnS2 films from tetrabutyltin via a solvothermal route at moderate temperature

Thin Solid Films

Volumn 436, Issue 2, 2003, Pages 203-207

  Yang, Qing ^a   Tang, Kaibin ^a   Wang, Chunrui ^a   Zuo, Jian ^a   Zhang, Daoyuan ^a   Qian, Yitai ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Raman scattering; Scanning electron microscopy; Sulfides; X ray diffraction

Indexed keywords

ALUMINA; ANISOTROPY; CRYSTAL STRUCTURE; DEPOSITION; GLASS; MOSSBAUER SPECTROSCOPY; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

PRECURSORS;

THIN FILMS;

EID: 0037863282     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00618-7     Document Type: Article

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