Electrical properties of epitaxially grown VOx thin films

Surface Science

Volumn 532-535, Issue , 2003, Pages 341-345

  Rata, A D ^a   Chezan, A R ^a   Presura, C ^a   Hibma, T ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Epitaxy; Semiconducting films; Vanadium oxide

Indexed keywords

COMPOSITION; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION;

HOPPING CONDUCTION;

VANADIUM COMPOUNDS;

EID: 0037846329     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00096-7     Document Type: Conference Paper

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