Measurement of bias voltage dependence of local barrier height at constant tip-sample separation

Surface Science

Volumn 532-535, Issue , 2003, Pages 1136-1139

  Yagyu, Shinjiro ^a   Yoshitake, Michiko ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Electron emission; Gold; Low index single crystal surfaces; Metallic surfaces; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Surface electronic phenomena (work function, surface potential, surface states, etc.)

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY;

BIAS VOLTAGE;

GOLD;

EID: 0037845262     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00407-2     Document Type: Conference Paper

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