메뉴 건너뛰기




Volumn 150, Issue 5, 2003, Pages

Chemical mechanical polishing of dielectric films using mixed abrasive slurries

Author keywords

[No Author keywords available]

Indexed keywords

ABRASIVES; ALUMINA; CHEMICAL MECHANICAL POLISHING; PARTICLE SIZE ANALYSIS; SILICA; SILICON NITRIDE; SLURRIES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037840413     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1564110     Document Type: Article
Times cited : (46)

References (28)
  • 14
    • 0037511573 scopus 로고    scopus 로고
    • Ph.D. Thesis, Clarkson University, Potsdam, NY
    • W. G. America, Ph.D. Thesis, Clarkson University, Potsdam, NY (2002).
    • (2002)
    • America, W.G.1
  • 21
    • 0037849157 scopus 로고    scopus 로고
    • Personal communication, Photran LLC, NH
    • Personal communication, Photran LLC, NH.
  • 24
    • 0000357680 scopus 로고
    • M. Tomozawa and R. Doremus, Editors; Academic Press, New York
    • T. Izumitani, in Treatise on Material Science and Technology, M. Tomozawa and R. Doremus, Editors, p. 115, Academic Press, New York (1979).
    • (1979) Treatise on Material Science and Technology , pp. 115
    • Izumitani, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.