메뉴 건너뛰기




Volumn 32, Issue 6, 2003, Pages 574-582

Effects of moisture and elevated temperature on reliability of interfacial adhesion in plastic packages

Author keywords

Hygrothermal aging; Interfacial adhesion; Lead frame; Metal coatings; Moisture sensitivity; Plastic packages

Indexed keywords

ADHESION; AGING OF MATERIALS; COMPOSITION EFFECTS; HEAT TREATMENT; INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); MOISTURE; PACKAGING MATERIALS; RELIABILITY; THERMAL EFFECTS;

EID: 0037821879     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-003-0144-9     Document Type: Article
Times cited : (30)

References (31)
  • 13
    • 0037996044 scopus 로고
    • IPC-SM-786A, The Institute for Interconnecting and Packaging Electronic Circuits, Lincolnwood, IL
    • IPC-SM-786A, The Institute for Interconnecting and Packaging Electronic Circuits, Lincolnwood, IL (1995).
    • (1995)
  • 14
    • 0037996041 scopus 로고
    • JEDEC Standard JESD22-A112
    • JEDEC Standard JESD22-A112 (1994).
    • (1994)
  • 18
    • 0028680077 scopus 로고
    • (Covina, CA: Society for the Advancement of Material and Process Engineering)
    • T.R. Tubbs and P. Procter, 7th Int. SAMPE Electronics Conf. (Covina, CA: Society for the Advancement of Material and Process Engineering, 1994), pp. 541-552.
    • (1994) 7th Int. SAMPE Electronics Conf. , pp. 541-552
    • Tubbs, T.R.1    Procter, P.2
  • 19
    • 84912073430 scopus 로고
    • S. Wu, J. Adhes. 5, 39 (1973).
    • (1973) J. Adhes. , vol.5 , pp. 39
    • Wu, S.1
  • 21
    • 0038672441 scopus 로고
    • (Piscataway, NJ: IEEE)
    • S. Kim, 41st ECTC (Piscataway, NJ: IEEE, 1991), 750-758.
    • (1991) 41st ECTC , pp. 750-758
    • Kim, S.1
  • 23
    • 84954204032 scopus 로고    scopus 로고
    • (Piscataway, NJ: IEEE)
    • S. Luo and C.P. Wong, EMAP 2000 (Piscataway, NJ: IEEE, 2000), pp. 243-250.
    • (2000) EMAP 2000 , pp. 243-250
    • Luo, S.1    Wong, C.P.2
  • 25
    • 0032630749 scopus 로고    scopus 로고
    • (Piscataway, NJ: IEEE)
    • Y. Tomioka and J. Miyake, 49th ECTC (Piscataway, NJ: IEEE, 1999), pp. 714-720.
    • (1999) 49th ECTC , pp. 714-720
    • Tomioka, Y.1    Miyake, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.