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Volumn 2, Issue , 2003, Pages 1303-1308
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Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
DOPING (ADDITIVES);
SPURIOUS SIGNAL NOISE;
SUBSTRATES;
SWITCHING;
TRANSCEIVERS;
CHOPPERS (CIRCUITS);
CMOS INTEGRATED CIRCUITS;
COUPLED CIRCUITS;
INTEGRATED CIRCUITS;
NOISE POLLUTION;
RADIO TRANSCEIVERS;
SILICON;
SWITCHING CIRCUITS;
SUBSTRATE NOISE IMPACT;
CMOS INTEGRATED CIRCUITS;
LOW NOISE AMPLIFIERS;
CIRCUIT NOISE;
CIRCUIT OPTIMIZATION;
INTEGRATED CIRCUIT NOISE;
NOISE MEASUREMENTS;
RADIO FREQUENCIES;
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EID: 0037821605
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (5)
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