Analysis of dynamic dielectric recovery and statistical properties for vacuum circuit-breakers with multi-breaks

Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering

Volumn 23, Issue 2, 2003, Pages 82-87

  Liao, Min Fu ^a   Duan, Xiong Ying ^a   Zou, Ji Yan ^a   Cong, Ji Yuan ^a  

^a DALIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Breakdown weak points; Double breaks; Dynamic dielectric recovery; Multi breaks; Statistical property; Vacuum circuit breakers

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC BREAKDOWN; ELECTRIC POWER TRANSMISSION; EQUIVALENT CIRCUITS;

BREAKDOWN WEAK POINTS; DYNAMIC DIELECTRIC RECOVERY; STATISTICAL PROPERTY; VACUUM CIRCUIT BREAKERS;

ELECTRIC CIRCUIT BREAKERS;

EID: 0037799773     PISSN: 02588013     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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