Statistical property of electric breakdown in vacuum interrupters under impulse stress

Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering

Volumn 16, Issue 5, 1996, Pages 312-314,-327

  He, Junjia ^a   Zou, Jiyan ^a   Zhang, Hanming ^a   Li, Zhengxin ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT BREAKING ARCS; ELECTRIC INSULATION TESTING; STATISTICAL METHODS; STATISTICAL TESTS;

IMPULSE STRESS; VACUUM INTERRUPTER;

ELECTRIC BREAKDOWN;

EID: 0030232635     PISSN: 02588013     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)