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Volumn 6, Issue 4, 1999, Pages 405-409

Influence of grading capacitors on the breaking capacity of two vacuum interrupters in series

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; VACUUM TECHNOLOGY; VOLTAGE CONTROL;

EID: 0033363460     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.788734     Document Type: Article
Times cited : (69)

References (6)
  • 2
    • 33749900873 scopus 로고    scopus 로고
    • Informationsmaterial der Siemens AG, Einpoliger Vakuumschalter, Geschäftszweig Bahnstromversorgung (E 43), Erlangen
    • Informationsmaterial der Siemens AG, Bahnstromversorgung von Siemens, Einpoliger Vakuumschalter, Geschäftszweig Bahnstromversorgung (E 43), Erlangen.
    • Bahnstromversorgung von Siemens
  • 4
    • 0031210829 scopus 로고    scopus 로고
    • Fundamental Studies on Vacuum Circuit Breaker Arc Quenching Limits with a Synthetic Test Circuit
    • August
    • T. Betz and D. König, "Fundamental Studies on Vacuum Circuit Breaker Arc Quenching Limits with a Synthetic Test Circuit", IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 4, No. 4, pp. 365-369, August 1997.
    • (1997) IEEE Transactions on Dielectrics and Electrical Insulation , vol.4 , Issue.4 , pp. 365-369
    • Betz, T.1    König, D.2
  • 5
    • 0031208119 scopus 로고    scopus 로고
    • Simulation of Reignition Processes of Vacuum Circuit Breakers in Series
    • August
    • T. Betz, "Simulation of Reignition Processes of Vacuum Circuit Breakers in Series", IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 4, No. 4, pp. 370-373, August 1997.
    • (1997) IEEE Transactions on Dielectrics and Electrical Insulation , vol.4 , Issue.4 , pp. 370-373
    • Betz, T.1
  • 6
    • 0029698854 scopus 로고    scopus 로고
    • Double Breaks in Vacuum: Technical Benefit and Flashover Mechanism
    • Montreal, Quebec, Canada
    • P. Sentker and H. C. Kärner, "Double Breaks in Vacuum: Technical Benefit and Flashover Mechanism", IEEE Int. Sympos. on El. Insulation, Montreal, Quebec, Canada, pp. 353-356, 1996.
    • (1996) IEEE Int. Sympos. on El. Insulation , pp. 353-356
    • Sentker, P.1    Kärner, H.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.