Measurement of low-level strain retardation in optical materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3121, Issue , 1997, Pages 23-27

  Oakberg, Theodore C ^a  

^a Hinds Instruments Incorporated   (United States)

Author keywords

Birefringence; Optical materials; Photoelastic modulator; Retardation; Strain

Indexed keywords

LIGHT MODULATORS; OPTICAL MATERIALS; OPTICAL VARIABLES MEASUREMENT; PHOTOELASTICITY; STRAIN;

PHOTOELASTIC MODULATORS; STRAIN RETARDARTION;

BIREFRINGENCE;

EID: 0031288819     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278974     Document Type: Conference Paper

References (7)

1. Measurement of low-level strain birefringence in optical elements using a photoelastic modulator
2. Modulated interference effects: Use of photoelastic modulators with lasers
3. Origin of modulated interference effects in photoelastic modulators
4. Measurement of waveplate retardation using a photoelastic modulator