PEEM - A spectromicroscopic tool for mc-Si surface evaluation

Solar Energy Materials and Solar Cells

Volumn 72, Issue 1-4, 2002, Pages 517-523

  Hoffmann, P ^a   Mikalo, R P ^a   Schmeisser D ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Multicrystalline silicon; PEEM; Photoelectron spectroscopy; Spectromicroscopy

Indexed keywords

BINDING ENERGY; CHEMICAL POLISHING; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; IMAGING TECHNIQUES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PRECIPITATION (CHEMICAL); SILICON; SYNCHROTRONS;

MULTICRYSTALLINE SILICON;

ELECTRON MICROSCOPY;

EID: 0036533245     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(01)00200-8     Document Type: Conference Paper

References (13)