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Volumn , Issue , 2003, Pages 244-249

Flip chip assembly on PCB substrates with coined solder bumps

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; FLIP CHIP DEVICES; MECHANICAL TESTING; MELTING; PRINTED CIRCUIT BOARDS; RELIABILITY; SUBSTRATES; TEMPERATURE; THERMAL CYCLING;

EID: 0037674970     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (10)
  • 1
  • 2
    • 0037818457 scopus 로고    scopus 로고
    • Flip-chip technology on organic pin grid array packages
    • Mirng-Ji Lii et al, "Flip-Chip Technology on Organic Pin Grid Array Packages", Intel Technology Journal Q3, 2000
    • (2000) Intel Technology Journal , vol.Q3
    • Lii, M.-J.1
  • 4
    • 51649143798 scopus 로고
    • The growth of Cu-Sn intermetallic at a pretinned copper/solder interface
    • A.J. Sunwoo et al, The growth of Cu-Sn intermetallic at a pretinned copper/solder interface, Metall. Trans., Vol. A23, No.4 (1992), pp. 1323-1332
    • (1992) Metall. Trans. , vol.A23 , Issue.4 , pp. 1323-1332
    • Sunwoo, A.J.1
  • 5
    • 0028494896 scopus 로고
    • The interaction kinetics and compound formation between electroless Ni-P and solder
    • C.-Y. Lee and K.-L. Lin, "The interaction kinetics and compound formation between electroless Ni-P and solder", Thin Solid Films, Vol. 249, No.2 (1994), pp. 201-206.
    • (1994) Thin Solid Films , vol.249 , Issue.2 , pp. 201-206
    • Lee, C.-Y.1    Lin, K.-L.2
  • 6
    • 0035694034 scopus 로고    scopus 로고
    • Reliability evaluations of under bump metallurgy in two solder systems
    • Y. Guo, S.-M. Kuo, and C. Zhang, "Reliability evaluations of under bump metallurgy in two solder systems", IEEE Trans. on CPT, Vol. 24, No.2 (2001), pp.655-660
    • (2001) IEEE Trans. on CPT , vol.24 , Issue.2 , pp. 655-660
    • Guo, Y.1    Kuo, S.-M.2    Zhang, C.3
  • 7
    • 0035155326 scopus 로고    scopus 로고
    • Use of muticomponent phase diagrams for predicting phase evolution in solder/conductor systems
    • K. Zeng, J.K. Kivilahti, "Use of muticomponent phase diagrams for predicting phase evolution in solder/conductor systems", J. Electron. Mater., Vol. 30, No.1 (2001) pp. 35-44
    • (2001) J. Electron. Mater. , vol.30 , Issue.1 , pp. 35-44
    • Zeng, K.1    Kivilahti, J.K.2
  • 8
    • 0030106421 scopus 로고    scopus 로고
    • Effect of solid state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joint
    • R.E. Pratt, E.I.Stromswold, D.J. Quesnel, "Effect of solid state intermetallic growth on the fracture toughness of Cu/63Sn-37Pb solder joint, IEEE Trans. CPMT-A, Vol. 19, No. 1 (1996), pp. 134-141.
    • (1996) IEEE Trans. CPMT-A , vol.19 , Issue.1 , pp. 134-141
    • Pratt, R.E.1    Stromswold, E.I.2    Quesnel, D.J.3
  • 10
    • 0035339984 scopus 로고    scopus 로고
    • Wetting reaction vs. solid state aging of eutectic SnPb on Cu
    • K.N.Tu et al., "Wetting reaction vs. solid state aging of eutectic SnPb on Cu", J. Appl. Phys., Vol. 8, No. 9 (2000), pp. 4843-4849
    • (2000) J. Appl. Phys. , vol.8 , Issue.9 , pp. 4843-4849
    • Tu, K.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.