Micromachined silicon torsional resonator for magnetic anisotropy measurement

Review of Scientific Instruments

Volumn 69, Issue 11, 1998, Pages 3908-3912

  Morillo, Jaime ^a,c   Su, Quanmin ^a   Panchapakesan, Balaji ^a   Wuttig, Manfred ^a   Novotny, Donald ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001745275     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149198     Document Type: Article

References (10)

1. H. Zijlstra, in Series of Monographs on Selected Topics in Solid State Physics, edited by E. P. Wohlfarth (North-Holland, Amsterdam, 1967), Vol. IX, Chap. 5.
2. H. Zijlstra, Rev. Sci. Instrum. 32, 634 (1961).
3. Certain commercial instruments and materials are identified in this article in order to adequately specify the experimental procedures. Such identification does not imply recommendation or endorsement by the NIST, nor does it imply that these are necessarily the best for the purpose.
4. Freon© is a copyrighted name of the DuPont Co.
5. All of the uncertainties are measurement uncertainties obtained from estimated error budgets.
6. Y. Zheng, Master's thesis, University of Maryland, College Park, MD 20742, 1995, p. 20.
7. Metglas© is a copyrighted name of Allied Signal Inc.
8. A. S. Novick and B. S. Berry, Anelastic Relaxations in Crystalline Solids (Academic, New York, 1972).
9. Y. Wen, Elastometer model AE0011, Vibran Technologies Inc., 335 Paintbranch Drive, College Park, MD 20742 (1996), http:// www.vibran.com.
10. F. Schatz, M. Hirscher, G. Flik, and H. Kronmuller, Phys. Status Solidi A 137, 197 (1993).