메뉴 건너뛰기




Volumn 3511, Issue , 1998, Pages 288-296

Design criteria of buckling microbridges

Author keywords

Buckling; Microbridge

Indexed keywords

ANISOTROPY; BENDING (DEFORMATION); BOUNDARY CONDITIONS; BUCKLING; ETCHING; MICROMACHINING; RESIDUAL STRESSES; SILICA; THIN FILMS;

EID: 0037660496     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.324313     Document Type: Conference Paper
Times cited : (2)

References (11)
  • 1
    • 0030230992 scopus 로고    scopus 로고
    • Determining mean and gradient residual stresses in thin films using micromachined cantilevers
    • W. Fang and J.A. Wickert, "Determining mean and gradient residual stresses in thin films using micromachined cantilevers," J. of Micromechanics and Microengineering, 6, pp. 301-309, 1996.
    • (1996) J. of Micromechanics and Microengineering , vol.6 , pp. 301-309
    • Fang, W.1    Wickert, J.A.2
  • 2
    • 0001424495 scopus 로고
    • Novel microstructures for the in situ measurement of mechanical properties of thin films
    • M. Mehregany, R.T. Howe, and S.D. Senturia, "Novel microstructures for the in situ measurement of mechanical properties of thin films," J. of Appl. Phys., 62, pp. 3579-3584, 1987.
    • (1987) J. of Appl. Phys. , vol.62 , pp. 3579-3584
    • Mehregany, M.1    Howe, R.T.2    Senturia, S.D.3
  • 5
    • 0005589014 scopus 로고    scopus 로고
    • The fabrication and discussion of silicon nitride membranes by chemical vapor deposition
    • Master thesis, National Chiao Tung University, Taiwan
    • Y. Chen, "The fabrication and discussion of silicon nitride membranes by chemical vapor deposition," Master thesis, National Chiao Tung University, Taiwan, 1997.
    • (1997)
    • Chen, Y.1
  • 8
    • 33749944166 scopus 로고
    • A simple technique for the determination of mechanical strain in thin films with application to polysilicon
    • H. Guckel, T. Randazzo, and D.W. Burns, "A simple technique for the determination of mechanical strain in thin films with application to polysilicon," J. of Applied Physics, 57, pp. 1671-1675, 1985.
    • (1985) J. of Applied Physics , vol.57 , pp. 1671-1675
    • Guckel, H.1    Randazzo, T.2    Burns, D.W.3
  • 10
    • 0000915839 scopus 로고
    • Detection of discontinuities in passivating layers on silicon by NaOH anisotropic etch
    • I.J. Pugacz-Muraszkiewicz, "Detection of discontinuities in passivating layers on silicon by NaOH anisotropic etch," IBM J. of Research and Development, 16, pp. 523-529, 1972.
    • (1972) IBM J. of Research and Development , vol.16 , pp. 523-529
    • Pugacz-Muraszkiewicz, I.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.