메뉴 건너뛰기




Volumn 43, Issue 5, 2003, Pages 811-817

Development of the green plastic encapsulation for high density wirebonded leaded packages

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; ELECTRONICS INDUSTRY; ENCAPSULATION; ENVIRONMENTAL PROTECTION; FLAME RETARDANTS; HALOGEN COMPOUNDS; LEAD; MOISTURE; PLASTICS APPLICATIONS; SHEET MOLDING COMPOUNDS;

EID: 0037651052     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00061-1     Document Type: Article
Times cited : (13)

References (10)
  • 3
    • 0038088002 scopus 로고    scopus 로고
    • Environmentally safe mold compound - Evaluation of new flame retardants
    • Manalac R., Cheah B., Alimagno J. Environmentally safe mold compound - evaluation of new flame retardants. Advanced Packaging. 2(November):2001;31-36.
    • (2001) Advanced Packaging , vol.2 , Issue.NOVEMBER , pp. 31-36
    • Manalac, R.1    Cheah, B.2    Alimagno, J.3
  • 4
    • 0034833282 scopus 로고    scopus 로고
    • High reliable and environmental friendly molding compound for CABGA package
    • Kong BS et al. High reliable and environmental friendly molding compound for CABGA package. In: 51st Electronic Components and Technology Conference (ECTC), 2001. p. 1393-7.
    • (2001) 51st Electronic Components and Technology Conference (ECTC) , pp. 1393-1397
    • Kong, B.S.1
  • 7
    • 0029709222 scopus 로고    scopus 로고
    • Effects of moisture and delamination on cracking of plastic IC packages during solder reflow
    • Tay AAO, Lin TY. Effects of moisture and delamination on cracking of plastic IC packages during solder reflow. In: Proceedings of the 46th ECTC, 1996. p. 777-82.
    • (1996) Proceedings of the 46th ECTC , pp. 777-782
    • Tay, A.A.O.1    Lin, T.Y.2
  • 8
    • 0038088004 scopus 로고    scopus 로고
    • Dynamics of moisture diffusion, hygrothermal stresses and delamination in plastic IC packages
    • Advances in Electronic Packaging
    • Lin TY, Tay AAO. Dynamics of moisture diffusion, hygrothermal stresses and delamination in plastic IC packages. ASME EEP, vol. 19-1, Advances in Electronic Packaging, 1997. p. 1429-36.
    • (1997) ASME EEP , vol.19 , Issue.1 , pp. 1429-1436
    • Lin, T.Y.1    Tay, A.A.O.2
  • 10
    • 0027727081 scopus 로고
    • Wirebound deformation during molding of IC packages
    • Advances in Electronic Packaging
    • Tay AAO, Yeo KS, Wu JH. Wirebound deformation during molding of IC packages. ASME EEP, vol. 3, Advances in Electronic Packaging, 1993. p. 233-41.
    • (1993) ASME EEP , vol.3 , pp. 233-241
    • Tay, A.A.O.1    Yeo, K.S.2    Wu, J.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.