High-pressure X-ray diffraction study of bulk- and nanocrystalline GaN

Journal of Applied Crystallography

Volumn 36, Issue 3 II, 2003, Pages 920-925

  Jorgensen J E ^a   Jakobsen, J M ^a   Jiang, J Z ^b   Gerward, L ^b   Olsen, J Staun ^c  

^a AARHUS UNIVERSITY   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; NITROGEN DERIVATIVE; SODIUM CHLORIDE;

ANALYTIC METHOD; ARTICLE; COVALENT BOND; CRYSTAL STRUCTURE; PRESSURE; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

STAPHYLOCOCCUS PHAGE 187;

EID: 0037643465     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803005375     Document Type: Article

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