Micromagnetic characterization of the reversal of Co/Cu/Co thin-film elements

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 7933-7935

  Redjdal, M ^a   Ruane, M F ^a   Humphrey, F B ^a   Castano F J ^b   Ross, C A ^b  

^a BOSTON UNIVERSITY   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; DAMPING; MAGNETIZATION; MAGNETORESISTANCE; RANDOM ACCESS STORAGE; SWITCHING;

THIN-FILM ELEMENTS;

THIN FILMS;

EID: 0037642284     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1558081     Document Type: Conference Paper

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