Mn diffusion effect in the exchange biased NiFe/FeMn/NiFe trilayers

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6602-6604

  Kim, S W ^a   Kim, J K ^a   Kim, J H ^b   Kim, B K ^b   Lee, J Y ^b   Lee, S S ^b   Hwang, D G ^b   Rhee, J R ^c  

^a Dankook University   (South Korea)

^b Sangji University   (South Korea)

^c Sookmyung Women's University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; DIFFUSION; FILM GROWTH; INTERFACES (MATERIALS); MANGANESE; MULTILAYERS;

EXCHANGE BIAS FIELDS;

NICKEL ALLOYS;

EID: 0037639673     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557238     Document Type: Conference Paper

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