Thermal degradation of spin valve multilayers caused by Mn migration

Journal of Applied Physics

Volumn 87, Issue 5, 2000, Pages 2469-2471

  Takiguchi, Masafumi ^a   Ishii, Satoru ^a   Makino, Eiji ^a   Okabe, Akihiko ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000348003     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372204     Document Type: Article

References (6)

1. B. Dieny, V. S. Speriosu, S. Metin, S. S. P. Parkin, B. A. Gurney, P. Baumgart, and D. R. Wilhoit, J. Appl. Phys. 69, 4774 (1991).
2. T. C. Huang, J.-P. Nozieres, V. S. Speriosu, B. A. Gurney, and H. Lefakis, Appl. Phys. Lett. 62, 1478 (1993).
3. R. E. Fontana, Jr., IEEE Trans. Magn. 31-6, 2579 (1995).
4. V. S. Speriosu, J. P. Nozieres, B. A. Gurney, B. Dieny, T. C. Huang, and H. Lefakis, Phys. Rev. B 47, 11579 (1993).
5. A. Bukaluk, Phys. Status Solidi A 118, 99 (1990).
6. A. Maesaka, N. Sugawara, A. Okabe, and M. Itabashi, J. Appl. Phys. 83, 7628 (1998).