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Volumn 260, Issue 1, 2001, Pages 69-74
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Characteristics of Pb(Zr, Ti)O3 thin films prepared on various substrates by source gas pulse-introduced metalorganic chemical vapor deposition
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Author keywords
deposition temperature; MOCVD; Pb(Zr, Ti)O3; substrate
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Indexed keywords
DEPOSITION TEMPERATURES;
LOW DEPOSITION TEMPERATURE;
METALORGANIC CHEMICAL VAPOR DEPOSITION;
MOCVD;
NUCLEATION SITES;
PB(ZR , TI)O;
PZT FILM;
REMANENT POLARIZATION;
SI SUBSTRATES;
SOURCE GAS;
VARIOUS SUBSTRATES;
FERROELECTRICITY;
LEAD;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
PLATINUM;
SILICON;
SILICON COMPOUNDS;
SUBSTRATES;
SURFACE ROUGHNESS;
THIN FILMS;
ZIRCONIUM;
DEPOSITION;
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EID: 0037568562
PISSN: 00150193
EISSN: 15635112
Source Type: Journal
DOI: 10.1080/00150190108015996 Document Type: Article |
Times cited : (4)
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References (6)
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