Mobile ion-induced data retention failure in nor flash memory cells

IEEE Transactions on Device and Materials Reliability

Volumn 1, Issue 2, 2001, Pages 128-132

  Lee, Wook H ^a   Lee, Dong Kyu ^a   Kim, Keon Soo ^a   Ahn, Kun Ok ^a   Suh, Kang Deog ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

Charge gain; Charge loss; Data retention; Mobile ion; NOR flash

Indexed keywords

EID: 0037531175     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/7298.956707     Document Type: Article

References (9)

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