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Volumn , Issue , 1983, Pages 106-113
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NEW EPROM DATA-LOSS MECHANISMS.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CONTAMINATION CHARGE LOSS;
ELECTRICALLY-PROGRAMMABLE READ-ONLY MEMORY (EPROM);
EPROM DATA-LOSS MECHANISMS;
INTRINSIC CHARGE LOSS;
OXIDE DEFECTS;
REACTIVATION RATIO;
DATA STORAGE, SEMICONDUCTOR;
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EID: 0020943292
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (26)
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References (0)
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