Morphological evolution driven by strain induced surface diffusion

Thin Solid Films

Volumn 424, Issue 1, 2003, Pages 9-14

  Zhang, Y W ^a   Bower, A F ^b   Liu, P ^c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Brown University   (United States)

^c INSTITUTE OF HIGH PERFORMANCE COMPUTING   (Singapore)

Author keywords

Anisotropy; Stress; Surface diffusion; Thin film

Indexed keywords

ANISOTROPY; DIFFUSION; SELF ASSEMBLY; SEMICONDUCTOR QUANTUM DOTS; SURFACE PROPERTIES;

SURFACE DIFFUSION;

THIN FILMS;

EID: 0037460303     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00897-0     Document Type: Conference Paper

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