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Volumn 428, Issue 1-2, 2003, Pages 123-128

Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2 × 1-reconstructed Si(1 0 0) surfaces

Author keywords

Chemical shift; Photoelectron diffraction; Photoelectron spectroscopy; Silicon; Surface structure

Indexed keywords

COMPUTATIONAL METHODS; KINETIC ENERGY; PHOTOELECTRON SPECTROSCOPY; SILICON;

EID: 0037457108     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01235-X     Document Type: Article
Times cited : (7)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.