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Volumn 428, Issue 1-2, 2003, Pages 123-128
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Angle-scanned X-ray photoelectron diffraction of clean and hydrogen terminated 2 × 1-reconstructed Si(1 0 0) surfaces
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Author keywords
Chemical shift; Photoelectron diffraction; Photoelectron spectroscopy; Silicon; Surface structure
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Indexed keywords
COMPUTATIONAL METHODS;
KINETIC ENERGY;
PHOTOELECTRON SPECTROSCOPY;
SILICON;
PHOTOELECTRON DIFFRACTION;
SURFACE PHENOMENA;
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EID: 0037457108
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(02)01235-X Document Type: Article |
Times cited : (7)
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References (27)
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