Melt-threshold method to determine the thermal conductivity of thin films in phase-change optical recording stacks

Journal of Applied Physics

Volumn 93, Issue 6, 2003, Pages 3207-3213

  Meinders, Erwin R ^a   Peng, Chubing ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTALLIZATION; DIELECTRIC MATERIALS; MATHEMATICAL MODELS; MELTING; MOLTEN MATERIALS; OPTICAL RECORDING; OPTIMIZATION; REFLECTION; TEMPERATURE DISTRIBUTION; THERMAL CONDUCTIVITY;

DIELECTRIC LAYERS;

THIN FILMS;

EID: 0037444939     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1544651     Document Type: Article

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