Characterizing the reflectance of periodic layered media

Optics Communications

Volumn 218, Issue 1-3, 2003, Pages 43-47

  Monzon J J ^a   Yonte, T ^a   Sanchez Soto L L ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Bragg reflectors; Multilayers; Thin films

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; LIGHT REFLECTION; MATRIX ALGEBRA; SOLID STATE PHYSICS; THIN FILMS;

BRAGG REFLECTORS;

OPTICAL MULTILAYERS;

EID: 0037443621     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(03)01192-1     Document Type: Article

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