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Volumn 26, Issue 18, 2001, Pages 1400-1402

Simple trace criterion for classification of multilayers

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL DECOMPOSITIONS;

EID: 0141839155     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.001400     Document Type: Article
Times cited : (18)

References (18)
  • 2
    • 0004204007 scopus 로고
    • Kluwer Academic, Dordrecht, The Netherlands
    • J. Lekner, Theory of Reflection (Kluwer Academic, Dordrecht, The Netherlands, 1987).
    • (1987) Theory of Reflection
    • Lekner, J.1
  • 9
    • 84893983741 scopus 로고    scopus 로고
    • note
    • j denotes the refractive index of the jth medium.
  • 10
    • 0038695308 scopus 로고    scopus 로고
    • Ellipsometry of thin film systems
    • E. Wolf, ed. North-Holland, Amsterdam
    • I. Ohlídal and D. Franta, "Ellipsometry of thin film systems," in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 2000), Vol. 41, p. 181.
    • (2000) Progress in Optics , vol.41 , pp. 181
    • Ohlídal, I.1    Franta, D.2
  • 13
    • 84893972741 scopus 로고    scopus 로고
    • Ref. 12 may also be found at arXiv.org e-Print archive, Preprint physics/0104050
    • Ref. 12 may also be found at arXiv.org e-Print archive, Preprint physics/0104050, http://xxx.lanl.gov.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.